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Yantai ZK Optics Co., Ltd.
Custom fabrication of high precision glass parts. Spirit of enterprise: Integrity, Pragmatism, Innovation, Win-win, Appreciation. Tenet of enterprise: the Supremacy of Customer, the Excellence in
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Wavelength Dispersive X-Ray Fluorescence Spectrometer Optical Measuring Instrument

Yantai ZK Optics Co., Ltd.
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Wavelength Dispersive X-Ray Fluorescence Spectrometer Optical Measuring Instrument

Brand Name : ZKTD

Model Number : ZKTD-XFS104

Certification : None

Place of Origin : CHINA

MOQ : 1 set

Payment Terms : T/T

Supply Ability : 100 sets per month

Delivery Time : 2-4 weeks

Packaging Details : Safe packing

Measurable elements : 10 arbitrary elements from Na to U

Analysis algorithms : empirical coefficient algorithm and theoretical a -coefficient algorithm

AC220V power supply : 1KVA AC purified stabilized voltage power supply

High voltage supply : 200W (50KV4mA)

12-hour stability of tube voltage & tube current : less than 0.05 %

Vacuum pump : bi-phase -220V, 2 liters

Industrial computer : industrial 104 computer

Analysis accuracy : σn-1(24 hours, percent content)≤0.05 %

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Optical Measuring Instrument Wavelength Dispersive X-ray Fluorescence Spectrometer

ZKTD-XFS104 Compact Multi-channel X-ray Fluorescence Spectrometer, with configuration of 10 fixed channels and capability to analyze 10 elements simultaneously, is able to conduct elemental analysis of arbitrary ten elements from Na to U based on the users' requirements. It is widely used in coal, petroleum, kaolin, glass,cement, steel, powder metallurgy, refractory materials and environment protection, and accordingly an ideal choice for quality control in large and middle scaled enterprises.

Application Fields:

  • Building materials (cement, glass, ceramics)
  • Metallurgy (steel, non-ferrous metals)
  • Petroleum (trace elements S, Pb and so on)
  • Chemical Engineering
  • Geography and Mining
  • Commodity Inspection
  • Quality Inspection
  • Human Body Trace Elements Inspection

3. Product Features

Rapid and non-destructive analysis of powder and bulk samples.

Multi-channel high speed MCA offers timely measurement of every element peak, benefiting not only instrument debugging and failure diagnosis but also the enhancement of stability of the instrument.

Compared with sequential scan large power spectrometers, the instrument gains adequate analysis precision even when lower power and equal measurement time are adopted, which not only endows the instrument with high cost performance, but also prevents wearing of the goniometer, prolongs the service life of X-ray tube, minimizes failures of the high voltage power supply and reduces the maintenance cost of the whole instrument.

Wavelength Dispersive X-Ray Fluorescence Spectrometer Optical Measuring Instrument


Product Tags:

wavelength dispersive x ray fluorescence spectrometer

      

optical measuring x ray fluorescence spectrometer

      

wavelength dispersive xrf spectrometer

      
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